Hitachi High-Tech Science Launches EA1400 RoHS Analyzer for Hazardous Substance Control

The EA1400 helps customers to carry out the screening required to speed up and simplify RoHS testing in production environments and allows customers to update substance control criteria as directives change over time.

The new silicon drift detector (SDD) design improves accuracy and analysis speed for RoHS substances, such as cadmium and lead. A newly optimized X-ray irradiation method means that there is a more reproducible analysis of uneven and irregular surfaces. Additionally, the high-performance detector boosts the count rate for improved precision of trace elements giving superior measurement ability of lighter elements.

To ensure maximum productivity, screening for cadmium in brass – typically the most challenging aspect of XRF RoHS screening – is designed to be faster than traditional models, allowing for higher throughput. The software has an in-built feature that visually flags defined elements that are out of pre-setting concentration limits. Using the precision control software, the EA1400 automatically stops analysis once defined parameters are met. Pass/fail determination can be made before the defined measurement time. This increases throughput when multiple samples need to be measured and thus saving time without compromising your quality program.

Beyond RoHS screening, the EA1400 also has the capability to distinguish between the main components in slag (Si, Ca, Al, and Mg), polymers, minerals, chemicals, and other materials.

 

For customers in such variety of application fields as process and quality control of cement or slags, failure analysis of abnormal spot, and inspection of foreign matter as well as RoHS inspection, the EA1400 delivers on reducing measurement time, simplifying the management of measurement results, reducing operational mistakes, and improving efficiency.