ESPEC introduces the Large Highly Accelerated Stress Test System (HAST Chamber)

Features:

• Achieve shorter test times compared to humidity resistance tests under ordinary pressure.
• Available in two larger capacity types, in addition to the standard types.
• Features a standard mechanical door lock mechanism and door lock safety mechanism.

Conforms to various testing standards for semiconductors

IEC 60068-2-66          Compact electrical and electronic components (mainly non-hermetically sealed components)

IEC 60749-4                 Semiconductor devices

EIAJ ED-47001            Semiconductor devices

JESD22-A110E             Non-hermetically sealed (not hollow) device

JESD22-A102E            Non-hermetically sealed IC discrete device

*We recommend the M type chambers for tests conforming to the above testing standards.

Conforms to other testing standards

JIS C 60068-2-66        Aluminum metal corrosion of integrated circuits and semiconductor devices.

JPCA-ET08-2002        Printed circuit boards.

Contact us at (049) 544-1111 or email us at sales@edgeworthcorp.com for more details.