Pick & Place Test Handler: EXCEED-6000 Series

Robust PnP platform to ATE providing tri-temp testing environment. A reliable and high productivity solution for test BIN sorting, especially in small footprint IC package. Hardware configurations for 1, 2, 4, or 8 sites are available.

 

For more information, contact us at (049) 544-1111 or send us your inquiries at mariz.suarez@edgeworthcorp.com.

ModelExceed-6040HExceed-6080H
Test Layout1/2/41/2/4/8
Air Supply0.5Mpa, 250L/min0.5Mpa, 350L/min
Power SupplySingle phase 220V, 50/60 Hz 50ASingle phase 220V, 50/60 Hz 50A
Temperature TypeAmbient/HighAmbient/High
Pick-up head2x2 module2x2 module
UPH8,5008,500
Index Time380ms380ms
Contact Force120kg (option to upgrade: 240kg)120kg (option to upgrade: 240kg)
Socket Opening210x140 mm210x140 mm
Dimension1700 (L) x 1400 (W) x 1890 (H) mm1700 (L) x 1400 (W) x 1890 (H) mm
Package TypeBGA, QFP, TQFP, CSP, QFN, TSOP, etc.BGA, QFP, TQFP, CSP, QFN, TSOP, etc.
Package Size2x2 mm to 50x50 mm2x2 mm to 50x50 mm
Jam Rate< 1/10000< 1/10000
Tray TypeJEDECJEDEC
Temperature Range50°C to 100°C ±2°C 100°C to 130°C ±3°C50°C to 100°C ±2°C 100°C to 130°C ±3°C
Number of SortingAuto Tray x3, Fix Tray x 3Auto Tray x3, Fix Tray x 3
Tester InterfaceGPIB, TTL, RS232, NetworkGPIB, TTL, RS232, Network