Robust PnP platform to ATE providing tri-temp testing environment. A reliable and high productivity solution for test BIN sorting, especially in small footprint IC package. Hardware configurations for 1, 2, 4, 8, 12, 16, or 32 sites are available.
For more information, contact us at (049) 544-1111 or send us your inquiries at mariz.suarez@edgeworthcorp.com.
Compatible with standard kits for Seiko, Epson, and Hontech.
| Model | Exceed-8016H |
| Test Layout | 1/2/4/8/16 |
| Air Supply | 0.5Mpa, 550L/min |
| Power Supply | Single phase 220V, 50/60 Hz 30A*2 |
| Temperature Type | Ambient/High |
| Pick-up head | 2x4 module |
| UPH | 13,500 |
| Index time | 380ms |
| Contact Force | up to 480kg |
| Socket Opening | 300x135 mm |
| Dimension | 2000 (L) x 1490 (W) x 2200 (H) mm |
| Weight | Approx. 1500kg |
| Package Type | QFN, QFP, BGA, LGA, PLCC, PGA, CSP, TSOP, etc. |
| Package Size | 2x2 to 70x70 mm |
| Jam Rate | < 1/10000 |
| Tray Type | JEDEC |
| Temperature Range | 50°C to 100°C ±2°C 100°C to 130°C ±3°C |
| Number of Sorting | Auto Tray x3, Fix Tray x3 |
| Tester Interface | GPIB, TTL, RS232, Network |
